How to Identify Auger Peaks in XPS Spectra - The Easy Way!
How to Identify OJ PS and XPS Spectrum
Understanding Peaks in XPS Spectrum
- The video discusses how to recognize and identify OJ PS (Auger Peaks) and XPS (X-ray Photoelectron Spectroscopy) Spectrum, emphasizing that the number of peaks depends on three parameters: chemical environment, physical state of the sample, and instrumental contributions.
- An example is given using lead as a heavy element, which shows a large number of photoelectron peaks. The OJ peaks are typically found at higher binding energy for most elements.
- A key identification feature of OJ PS is that they appear less intense compared to other peaks. High-resolution spectra show these as broad humps rather than sharp peaks.
Overview of the OJ Process
- The process begins with shining X-rays on core electrons, resulting in photoelectrons. When a vacancy is created in the core level, it can be filled by valence electrons, leading to the emission of an Auger electron.
- This process can create two holes when one electron fills a vacancy while another escapes from the outer shell; this phenomenon is referred to as "double."
Series Observable in Auger Electrons
- There are four main observable OJ series: KLL, LMM, MNN, and NNN. These series indicate which shells are involved in filling vacancies and emitting electrons.
- For larger elements like lead, all four series can be observed. Each notation (e.g., KLL or LMM) describes where the initial vacancy was created and which electron filled it.
Kinetic Energy Considerations
- The kinetic energy of an Auger electron correlates with the binding energies of core electrons involved in filling vacancies. It’s calculated based on differences between these binding energies.
- Importantly, the binding energy of core electrons remains constant regardless of the type of X-ray source used (aluminum vs magnesium), highlighting its intrinsic property related to material characteristics.
Independence from X-ray Source
- The kinetic energy of Auger electrons does not change with different X-ray sources; this independence emphasizes that variations in source do not affect measured values significantly.
- However, while kinetic energies remain consistent across sources, calculated binding energies may vary depending on specific conditions or assumptions made during analysis.